Characterization of the RuS2(100) surface by scanning tunneling microscopy, atomic force microscopy, and near-edge X-ray absorption fine structure measurements and electronic band structure calculations

Journal of Physical Chemistry B

Volumn 103, Issue 22, 1999, Pages 4649-4655

  Kelty, S P ^a   Li, J ^a   Chen, J G ^b   Chianelli, R R ^c   Ren, J ^d   Whangbo, M H ^d  

^a SETON HALL UNIVERSITY   (United States)

^b UNIVERSITY OF DELAWARE   (United States)

^c UNIVERSITY OF TEXAS AT EL PASO   (United States)

^d NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000643390     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp9842594     Document Type: Article

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