Absolute measurement of detector quantum efficiency using parametric downconversion

Applied Optics

Volumn 26, Issue 21, 1987, Pages 4616-4619

  Rarity, J G ^a   Ridley, K D ^a   Tapster, P R ^a  

^a DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000641958     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.26.004616     Document Type: Article

References (15)

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15. P. R. Tapster, J. G. Rarity, and J.S. Satchell, in preparation.