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Journal of Applied Physics

Volumn 63, Issue 11, 1988, Pages 5609-5611

Dislocation density reduction through annihilation in lattice-mismatched semiconductors grown by molecular-beam epitaxy

(4) Sheldon, P a Jones, K M a Al Jassim, M M a Yacobi, B G b

a NATIONAL RENEWABLE ENERGY LABORATORY (United States)

b VERIZON (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000639342 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.340343 Document Type: Article

Times cited : (70)

References (12)

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- Shaw, D.W.¹

2
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- (1985) J. Appl. Phys , vol.58 , pp. 4186
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3
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- Yamaguchi, M.¹ Yamamoto, A.² Itoh, Y.³

4
- 0346955939
- See, for example
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- Matthews, J.W.¹ Blakeslee, A.E.²

5
- 0004007866
- See, for example
- (1980) Appl. Phys. Lett , vol.37 , pp. 290
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6
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- (1987) Jpn. J. Appl. Phys , vol.26 , pp. L163
- Ishida, K.¹ Akiyama, M.² Nishi, S.³

7
- 84950877007
- Inst. Phys. Conf. Ser. No. 60 (Oxford University Press, Oxford, 1981), Sec. 4
- Microscopy of Semiconducting Materials , pp. 203
- Booker, G.R.¹

8
- 0020280583
- See, for example, (IEEE, San Diego, CA)
- (1982) Proceedings of the 16th IEEE Photovoltaics Specialists Conference , pp. 1143
- Tsaur, B.-Y.¹ Fan, J.C.C.² Turner, G.W.³ Davis, F.M.⁴ Gale, R.P.⁵

9
- 84950791418
- The stacking fault density was affected, but the overall density was much lower than the threading dislocation density. See, for example, Ref. 2.

10
- 51249188607
- (1975) J. Electron. Mater , vol.4 , pp. 1081
- Kressel, H.¹

11
- 0000575813
- See, for example
- (1986) Appl. Phys. Lett , vol.48 , pp. 1223
- Fisher, R.¹ Neuman, D.² Zabel, H.³ Morkoç, R.⁴ Choi, C.⁵ Otsuka, N.⁶

12
- 0003116783
- See, for example
- (1987) Appl. Phys. Lett , vol.50 , pp. 31
- Lee, J.W.¹ Shichijo, H.² Tsai, H.L.³ Matyi, R.L.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.