Applications of X-ray spectrometry

Applied Spectroscopy Reviews

Volumn 35, Issue 1-2, 2004, Pages 129-150

  Jenkins, Ron ^a   Gould, R W ^b   Gedcke, Dale ^c  

^a International Centre for Diffraction Data   (United States)

^b UNIVERSITY OF FLORIDA   (United States)

^c ORTEC Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000638201     PISSN: 05704928     EISSN: None     Source Type: Journal    
DOI: 10.1081/asr-100101222     Document Type: Review

References (11)

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3. G. A. Akopov, V. V. Berdikov, E. A. Zaitsev, B. S. Iokhin, and A. P. Krinitsyn, At. Energ., 60:64 (1986).
4. A. S. Frank, M. K. Schauble, and I. L. Preiss, J. Amer. Pathol., 122:421 (1986).
5. I. L. Preiss, T. Ptak, and A. S. Frank, Nucl. Instrum. Meth. Phys. Res. Sect. A(3):539 (1986).
6. Analytical Chemistry, Fundamental Reviews, American Chemical Society, published biannually.
7. CA SELECTS:X-RayAnalysis & Spectroscopy, Chemicals Abstracts Service, Columbus, Ohio, published bimonthly.
8. International Journal of X-ray Spectrometry, Wiley/Heyden, London, 1971-to date, published quarterly.
9. I. Adler, X-Ray Emission Spectrography in Geology, Elsevier, Amsterdam, 1966.
10. V. A. Trounova, V. S. Danilovich, V. B. Baryshev, and K. L. Zolotarev, Nucl. Instrum. Meth. Phys. Rev. A308:510 (1991).
11. V. A. Trounova, V. S. Danilovich, K. L. Zolotarev, et al., X-ray Spectrom., 23:187 (1994).