Scanning Tunneling Microscopy Characterization of Electrode Materials in Electrochemistry

Electroanalysis

Volumn 8, Issue 2, 1996, Pages 107-112

  Li, Jing ^a   Wang, Erkang ^a  

^a CHANGCHUN INSTITUTE OF APPLIED CHEMISTRY   (China)

Author keywords

Atomic resolution; Electrode activity; Electrode surface morphology; Scanning tunneling microscopy (STM)

Indexed keywords

ELECTRODES;

ATOMIC-RESOLUTION; ELECTRODE ACTIVITY; ELECTRODE MATERIAL; ELECTRODE SURFACE MORPHOLOGY; ELECTRODE SURFACES; EX SITU; IN-SITU SCANNING TUNNELING MICROSCOPIES; SCANNING TUNNELING MICROSCOPY; SURFACE MICROTOPOGRAPHY;

SCANNING TUNNELING MICROSCOPY;

EID: 0000635163     PISSN: 10400397     EISSN: None     Source Type: Journal    
DOI: 10.1002/elan.1140080202     Document Type: Review

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