The effects of manufacturing inaccuracies on the imaging properties of fresnel zone plates

Optica Acta

Volumn 30, Issue 10, 1983, Pages 1455-1462

  Simpson, M J ^a   Michette, A G ^a  

^a KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000635038     PISSN: 00303909     EISSN: None     Source Type: Journal    
DOI: 10.1080/713821074     Document Type: Article

References (6)

1. Schmahl, G., Rudolph, D., and Niemann, B., 1981, High Resolution Soft X-ray Optics, edited by E. Spiller, SPIE Proc., Vol. 316 (Bellingham: Society of Photo-optical Instrumentation Engineers), pp. 100-105.
2. Rarback, H., and Kirz, J., 1981, High Resolution Soft X-ray Optics, edited by E. Spiller, SPIE Proc., Vol. 316 (Bellingham: Society of Photo-optical Instrumentation Engineers), pp. 120-125.
3. Sayre, D., and Feder, R., 1980, Ann. N. Y. Acad. Sci., 342, 268-272.
4. Kirz, J., 1974, J. opt. Soc. Am., 64, 301-309.
5. Welford, W. T., 1974, Aberrations of the Symmetrical Optical System (New York: Academic Press), p. 206.
6. Sirohi, R. S., and Blume, H., 1975, Optica Acta, 22, 943-946.