Interval mapping of genes for quantitative resistance of maize to Setosphaeria turcica, cause of northern leaf blight, in a tropical environment

Molecular Breeding

Volumn 2, Issue 2, 1996, Pages 143-156

  Dingerdissen, A L ^a   Geiger, H H ^a   Lee, M ^b   Schechert, A ^a   Welz, H G ^a  

^a UNIVERSITY OF HOHENHEIM   (Germany)

^b IOWA STATE UNIVERSITY   (United States)

Author keywords

Interval mapping; Northern corn leaf blight; Quantitative resistance; Quantitative trait locus; Setosphaeria turcica; Zea mays

Indexed keywords

GRAIN (AGRICULTURAL PRODUCT); MAPPING; PLANTS (BOTANY);

AREA UNDER THE DISEASE PROGRESS CURVES; DISEASE SEVERITY; INCUBATION PERIODS; INTERVAL MAPPING; LEAF BLIGHTS; NORTHERN CORN LEAF BLIGHT; QUANTITATIVE RESISTANCE; QUANTITATIVE TRAIT LOCUS; SETOSPHERIUM TURCICA; ZEA MAYS;

GENES;

EID: 0000627218     PISSN: 13803743     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00441429     Document Type: Article

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