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Volumn 40, Issue 5, 1989, Pages 615-627

Electrostrictive stresses near crack-like flaws

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000626429     PISSN: 00442275     EISSN: 14209039     Source Type: Journal    
DOI: 10.1007/BF00945867     Document Type: Article
Times cited : (228)

References (11)
  • 3
    • 36549094983 scopus 로고
    • On mechanical stresses at cracks in dielectrics with application to dielectric breakdown
    • (1987) J. Appl. Phys. , vol.62 , pp. 3116-3122
    • McMeeking, R.M.1
  • 4
    • 84933766114 scopus 로고    scopus 로고
    • R. M. McMeeking, A J-integral for the analysis of electrically induced mechanical stress at cracks in elastic dielectrics. Int. J. Eng. Sci. (to appear).
  • 6
    • 84933766113 scopus 로고    scopus 로고
    • W. F. J. Deeg, Analysis of Dislocation, Crack and Inclusion Problems in Piezoelectric Solids. Ph.D. Dissertation, Stanford University 1980.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.