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Volumn 56, Issue 8, 1997, Pages 4620-4625

Copper-related defects in silicon: Electron-paramagnetic-resonance identification

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[No Author keywords available]

Indexed keywords


EID: 0000625144     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.4620     Document Type: Article
Times cited : (18)

References (29)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.