Observation of micro-inclusions in diamond by scanning X-ray analytical microscope

Diamond and Related Materials

Volumn 6, Issue 11, 1997, Pages 1680-1682

  Shimomura, S ^a   Kanda, H ^a   Nakazawa, H ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Micro inclusions; Scanning X ray analytical microscope; Sythetic diamond

Indexed keywords

EID: 0000624569     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0925-9635(07)00041-6     Document Type: Article

References (7)

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2. S. Shimomura, H. Nakazawa, Advances X-ray Anal. 35 (1992) 1289.
3. H. Nakazawa, J. Appl. Crysyallogr. 16 (1983) 239.
4. R.H. Wentorf, J. Phys. Chem. 75 (1971) 1833.
5. H.M. Strong, R.M. Cherenko, J. Phys. Chem. 75 (1971) 1838.
6. H. Kanda, T. Ohsawa, O. Fukunaga, I. Sunagawa, J. Cryst. Growth 94 (1989) 115.
7. H. Kanda, New Diamond 5 (1989) 22.