EELS investigation of the electron conduction-band states in wurtzite AlN and oxygen-doped AlN(O)

Physical Review B - Condensed Matter and Materials Physics

Volumn 58, Issue 8, 1998, Pages 5106-5115

  Serin, V ^a   Colliex, C ^b  

^a CNRS   (France)

^b UNIVERSITÉ PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000624407     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.5106     Document Type: Article

References (26)

1. E. Ruiz, S. Alvarez, and P. Alemany, Phys. Rev. B 49, 7115 (1994).
2. G. Partridge, Adv. Mater. 4, 51 (1992).
3. D. G. Böcker, R. W. Hamminger, J. Heinrich, J. Huber, and A. Roosen, Adv. Mater. 4, 169 (1992).
4. G. A. Slack, R. A. Tanzilli, R. O. Pohl, and J. W. Vandersande, J. Phys. Chem. Solids 48, 641 (1987).
5. B. Aspar, R. Rodriguez-Clemente, A. Figueras, B. Armas, and C. Combescure, J. Cryst. Growth 129, 56 (1993).
6. C. Colliex, M. Tencé, E. Lefevre, C. Mory, H. Hu, D. Bouchet, and C. Jeanguillaume, Mikrochim. Acta 71, 114 (1994).
7. M. Tencé, M. Quartuccio, and C. Colliex, Ultramicroscopy 42, 58 (1995).
8. S. Abaidia, V. Serin, G. Zanchi, Y. Kihn, and J. Sevely, Philos. Mag. A 72, 1657 (1995).
9. A. J. Craven, J. Microsc. 180, 250 (1995).
10. M. Williams, P. Kübler, and R. Gelatt, Phys. Rev. B 19, 6094 (1979).
11. P. Blaha, K. Schwartz, P. Sorantin, and B. Trickey, Comput. Phys. Commun. 59, 399 (1990).
12. O. K. Andersen, Phys. Rev. B 12, 3060 (1975).
13. O. K. Andersen and O. Jepsen, Phys. Rev. Lett. 56, 2571 (1984).
14. O. K. Andersen, O. Jepsen, and D. Glötzel, in Highlights of Condensed-matter Theory, edited by F. Bassani and F. Fumi (North Holland, New York, 1985).
15. W. R. L. Lambrecht and O. K. Andersen, Phys. Rev. B 34, 2439 (1986).
16. J. P. Perdew, Phys. Rev. B 33, 8822 (1986).
17. P. L. Hansen, R. Brydson, and D. W. McComb, Microsc. Microanal. Microstruct. 3, 213 (1992).
18. S. Loughin, R. H. French, W. Y. Ching, Y. N. Xu, and G. A. Slack, Appl. Phys. Lett. 63, 1182 (1993).
19. W. Y. Ching and B. N. Harmon, Phys. Rev. B 34, 5305 (1986).
20. L. F. Mattheiss, Phys. Rev. 133, A1399 (1994).
21. D. D. Vvedensky, D. K. Saldin, and J. B. Pendry, Comput. Phys. Commun. 40, 421 (1986).
22. C. Colliex, in Advances in Optical and Electron Microscopy, edited by R. Barer and V. E. Cosslett (Academic, New York, 1984), p. 110.
23. D. Dorignac, A. Mazel, Y. Kihn, and J. Sevely, J. Eur. Ceram. Soc. 13, 345 (1994).
24. G. Van Tendeloo, K. T. Faber, and G. Thomas, J. Mater. Sci. 18, 525 (1983).
25. J. Bruley, A. D. Westwood, R. A. Youngman, J. C. Zhao, and M. R. Notis, in Structure and Properties of Interfaces in Ceramics, edited by D. A. Bonnell, U. Chowdhry, and M. Ruhle, MRS Symposia Proceedings No. 357 (Materials Research Society, Pittsburgh, 1995), p. 265.
26. A. P. Hitchcock, Phys. Scr. T31, 159 (1990).