Tcl/Tk-based programs. III. CRITXPL: Graphical analysis of the X-PLOR refinement log files

Journal of Applied Crystallography

Volumn 32, Issue 2, 1999, Pages 376-377

  Urzhumtseva, L M ^a,c   Urzhumtsev, A G ^b,c  

^a INSTITUT DE GÉNÉTIQUE ET DE BIOLOGIE MOLÉCULAIRE ET CELLULAIRE   (France)

^b UNIVERSITÉ DE LORRAINE   (France)

^c RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

Author keywords

Interactive graphics; Refinement; Tcl Tk; X PLOR

Indexed keywords

EID: 0000622230     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889898011522     Document Type: Article

References (5)

1. Brünger, A. T. (1992) X-PLOR. A System for X-ray Crystallography and NMR, Version 3.1. Yale University, Connecticut, USA.
2. Brünger, A. T., Adams, P. D., Clore, G. M., DeLano, W. L., Gros, P., Grosse-Kunstleve, R. W., Jiang, J.-S., Kuszewski, J., Nilges, M., Pannu, N. S., Read, R. J., Rice, L. M., Simonson, T. & Warren, G. L. (1998). Acta Cryst. D54, 905-921.
3. Osterhout, J. K. (1993). Tcl and Tk Toolkit. Reading, MA: Addison-Wesley.
4. Urzhumtseva, L. M. & Urzhumtsev, A. G. (1996). CCP4 Newsletter on Protein Crystallography, 32b, 41-43.
5. Urzhumtseva, L. M. & Urzhumtsev, A. G. (1997). J. Appl. Cryst. 30, 402-410.