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Journal of Applied Physics

Volumn 87, Issue 6, 2000, Pages 2853-2856

Resonant Raman scattering from buried AlxGa1 - XN (x ≤ 0.17) layers in (Al, Ga, In)N heterostructures

(5) Yoshikawa, M a,b Wagner, J a Obloh, H a Kunzer, M a Maier, M a

a FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF (Germany)

b TORAY RESEARCH CENTER INC (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000621067 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.372268 Document Type: Article

Times cited : (16)

References (16)

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