Evidence for hole traps at the amorphous silicon/amorphous silicon-germanium heterostructure interface

Applied Physics Letters

Volumn 70, Issue 4, 1997, Pages 499-501

  Palsule, C ^a   Paschen, U ^a   Cohen, J D ^a   Yang, J ^b   Guha, S ^b  

^a UNIVERSITY OF OREGON   (United States)

^b United Solar Systems Corp   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000617117     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118192     Document Type: Article

References (7)

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