|
Volumn 25, Issue 5, 1986, Pages 542-554
|
Yield stress: A time-dependent property and how to measure it
|
Author keywords
characteristic time; measurement technique; observation time; thixotropy; Yield stress
|
Indexed keywords
|
EID: 0000615176
PISSN: 00354511
EISSN: 14351528
Source Type: Journal
DOI: 10.1007/BF01774406 Document Type: Article |
Times cited : (307)
|
References (26)
|