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Volumn 30, Issue 5, 1997, Pages 561-564

A simplified, texture-based method for intensity determination of overlapping reflections in powder diffraction

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000610455     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889897011023     Document Type: Article
Times cited : (20)

References (25)
  • 4
    • 0003893312 scopus 로고
    • Institut für Kristallographie & Petrographie, ETh, Zurich, Switzerland
    • Baerlocher, C. (1982). XRS-82. The X-ray Rietveld System. Institut für Kristallographie & Petrographie, ETh, Zurich, Switzerland.
    • (1982) XRS-82. The X-ray Rietveld System
    • Baerlocher, C.1
  • 5
    • 0004150613 scopus 로고
    • Modern Powder Diffraction
    • edited by D. L. Bish & J. E. Post. Mineralogical Society of America, Washington DC, USA
    • Bish, D. L. & Reynolds, R. C. (1989). Modern Powder Diffraction. Reviews in Mineralogy, edited by D. L. Bish & J. E. Post, p. 84. Mineralogical Society of America, Washington DC, USA.
    • (1989) Reviews in Mineralogy , pp. 84
    • Bish, D.L.1    Reynolds, R.C.2
  • 24
    • 85033150689 scopus 로고    scopus 로고
    • Toraya, H. (1996). Acta Cryst. A52(Suppl.), C-466-C-467.
    • (1996) Acta Cryst. , vol.A52 , Issue.SUPPL.
    • Toraya, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.