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Volumn 29, Issue 42, 1988, Pages 5437-5440

Studies on guest selective molecular recognition on an octadecyl silylated silicon surface using ellipsometry

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000603229     PISSN: 00404039     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-4039(00)82889-0     Document Type: Article
Times cited : (79)

References (8)
  • 5
    • 84919123636 scopus 로고    scopus 로고
    • 2-surface of N = 3.86 - i0.1, a film index of 1.45, and an ambient index of 1.0.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.