Observation of rapid direct charge transfer between deep defects in silicon

Physical Review Letters

Volumn 72, Issue 18, 1994, Pages 2939-2942

  Frens, A M ^a   Bennebroek, M T ^a   Zakrzewski, A ^a   Schmidt, J ^a   Chen, W M ^b   Janzen E ^b   Lindstrom J L ^b   Monemar, B ^b  

^a LEIDEN UNIVERSITY   (Netherlands)

^b LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000594023     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.72.2939     Document Type: Article

References (23)

1. ODMR and Electron Spin Echo Studies on the Non-Radiative Triplet State of the (V-O)° Defect in Silicon
2. The Dynamics of the Non-Radiative Triplet State of the (V-O)0 Defect in Silicon: Evidence for a Radical Pair Mechanism