Scaling and renormalization in transmittance of thin metal films near the percolation threshold

Applied Physics Letters

Volumn 52, Issue 5, 1988, Pages 373-374

  Yagil, Y ^a   Deutscher, G ^a  

^a TEL AVIV UNIVERSITY   (Israel)

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EID: 0000588758     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.99469     Document Type: Article

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