Formation of CdS nanoclusters within LB films of calixarene derivatives and study of their size-quantization

Materials Science and Engineering C

Volumn 8-9, Issue , 1999, Pages 171-177

  Nabok, A V ^a   Ray, A K ^a   Hassan, A K ^a   Titchmarsh, J M ^a   Davis, F ^b   Richardson, T ^c   Starovoitov, A ^d   Bayliss, S ^d  

^a SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

^b Gillette UKRDL   (United Kingdom)

^c UNIVERSITY OF SHEFFIELD   (United Kingdom)

^d DE MONTFORT UNIVERSITY   (United Kingdom)

Author keywords

AFM; CdS; Electron diffraction; Semiconductor nanoclusters; Size quantization; TEM

Indexed keywords

EID: 0000588397     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0928-4931(99)00012-0     Document Type: Article

References (11)

1. Fendler J.H., Meldrum F.C. Adv. Mater. 7(7):1995;607.
2. Erokhin V., Facci P., Carrara S., Nicolini C. Thin Solid Films. 284-285:1996;89.
3. Facci P., Erokhin V., Carrara S., Nicolini C. Proc. Natl. Acad. Sci. U.S.A. 93:1996;10556-10559.
4. Rauadel-Teixeir A., Leloup J., Barraud A. Mol. Cryst. Liq. Cryst. 134:1986;347.
5. Nabok A., Richardson T., Davis F., Stirling C.M.J. Langmuir. 13:1997;3198.
6. Nabok A.V., Richardson T., McCartney C., Cowlam N., Davis F., Stirling C.J.M., Ray A.K., Gasem V., Gibaud A. Thin Solid Films. 327-329:1998;510-514.
7. Ekimov A.I., Efros Al.L., Onuschenko A.A. Solid State Commun. 56(11):1985;921.
8. Kulish N.R., Kunetz V.P., Lisitsa M.P. Ukr. Fiz. Zh. 35:1990;1817. in Russian.
9. Ramakhrishna M.V., Friesner R.A. J. Chem. Phys. 95(11):1991;8309.
10. Tomasulo A., Ramakhrishna M.V. J. Chem. Phys. 105(9):1996;3612.
11. W.F. de Jong, General Crystallography, Freeman, San Francisco, 1959, p. 149.