Penetration depth measurements of single-crystal NbN films at millimeter-wave region

Applied Physics Letters

Volumn 68, Issue 4, 1996, Pages 562-563

  Komiyama, Bokuji ^a   Wang, Zhen ^a   Tonouchi, Masayoshi ^a  

^a NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000584607     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116400     Document Type: Article

References (7)

1. W. R. McGrath, J. A. Stren, H. H. S. Javadi, S. R. Cypher, B. D. Hunt, and H. G. LeDuc, IEEE Trans. Magn. INS 27, 2650 (1991).
2. Z. Wang, A. Kawakami, Y. Uzawa, and B. Komiyama, Appl. Phys. Lett. AIP 64, 584 (1992).
3. Z. Wang, A. Kawakami, Y. Uzawa, and B. Komiyama, Proceedings of the 75th International Symposium on Superconductivity (ISS'94), 991 (1994).
4. D. E. Oates, A. C. Anderson, C. C. Chin, J. S. Derov, G. Dresselhaus, and M. S. Dresselhause, Phys. Rev. B AIP 43, 7655 (1991).
5. M. S. Pambianchi, S. M. Anlage, E. S. Hellmann, E. H. Hartford, Jr., M. Bruns, and S. Y. Lee, Appl. Phys. Lett. AIP 64, 244 (1994).
6. B. Komiyama, H Shimakage, S. Miura, and H. Tsuge, Proceedings of the 24th European Microwave Conference, 986 (1994).
7. B. Komiyama, Z. Wang, and M Tonouchi, Extended Abstracts of the 5th International Superconductive Electronics Conference (ISEC'95), 488 1995.