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Applied Physics Letters

Volumn 69, Issue 15, 1996, Pages 2273-2275

Spectroellipsometry for characterization of Zn1 - XCdxSe multilayered structures on GaAs

(5) Lee, Joungchel a Collins, R W a Heyd, A R a,b Flack, F a Samarth, N a

a PENNSYLVANIA STATE UNIVERSITY (United States)

b Rudolph Research Corp (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000583967 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.117531 Document Type: Article

Times cited : (15)

References (15)

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