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Volumn 82, Issue 5, 1999, Pages 1196-1200

Grain-boundary migration and dielectric properties of semiconducting SrTiO3 in the SrTiO3-BaTiO3-CaTiO3 system

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EID: 0000582575     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1999.tb01895.x     Document Type: Article
Times cited : (15)

References (25)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.