Measurements of charge accumulation induced by monochromatic low-energy electrons at the surface of insulating samples

Journal of Applied Physics

Volumn 84, Issue 5, 1998, Pages 2740-2748

  Bass, A D ^a   Cloutier, P ^a   Sanche, L ^a  

^a UNIVERSITY OF SHERBROOKE   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000581747     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368388     Document Type: Article

References (35)

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35. 0 show an identical behavior. These electrometer measurements are insensitive to charge spreading in the beam or at the sample surface, because charge buildup is monitored over the entire surface, rather than over a limited region defined by the Kelvin probe head. Thus, the agreement between electrometer and Kelvin probe measurements suggests beam spreading does not affect the electron energy dependence of the trapping probability.