Absolute frequency atlas of molecular I2 lines at 532 nm

IEEE Transactions on Instrumentation and Measurement

Volumn 48, Issue 2, 1999, Pages 544-549

  Ye, Jun ^a,b,c   Robertsson, Lennart ^a,b,d   Picard, Susanne ^a,b,d   Ma, Long Sheng ^a,b,e   Hall, John L ^a,b  

^a UNIVERSITY OF COLORADO   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^d PAVILLON DE BRETEUIL   (France)

^e EAST CHINA NORMAL UNIVERSITY   (China)

Author keywords

Frequency control; Frequency measurement; Frequency modulation; Laser spectroscopy; Laser stability; Measurement standards; YAG lasers

Indexed keywords

EID: 0000581281     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.769654     Document Type: Article

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