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Applied Physics Letters

Volumn 69, Issue 21, 1996, Pages 3245-3247

Strain field imaging on Si/SiGe(001)-(2x1) surfaces by low-energy electron microscopy and scanning tunneling microscopy

(6) Jones, D E a Pelz, J P a Hong, Y b Tsong, I S T b Xie, Y H c Silverman, P J c

a OHIO STATE UNIVERSITY (United States)

b ARIZONA STATE UNIVERSITY (United States)

c LUCENT TECHNOLOGIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000574587 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.118024 Document Type: Article

Times cited : (9)

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