Imaging of transition radiation from thin films on a silicon substrate using a light detection system combined with TEM

Journal of Electron Microscopy

Volumn 45, Issue 1, 1996, Pages 64-72

  Yamamoto, Naoki ^a   Toda, Akio ^a   Araya, Katsuhiro ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Cathodoluminescence; Cherenkov radiation; Transition radiation; Transmission electron microscopy

Indexed keywords

DIELECTRIC PROPERTIES; EMISSION SPECTROSCOPY; SILICON; SUBSTRATES; THIN FILMS;

CHERENKOV RADIATIONS; EMISSION SPECTRUMS; LIGHT DETECTION; LIGHT IMAGING; LIGHT-DETECTION SYSTEMS; SILICON SUBSTRATES; THIN RIM; THIN-FILMS; TRANSITION RADIATION; TRANSMISSION ELECTRON;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 0000558985     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023414     Document Type: Article

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