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Volumn 9, Issue 2, 1990, Pages 141-186
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Charge‐remote fragmentations: Analytical applications and fundamental studies
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000543410
PISSN: 02777037
EISSN: 10982787
Source Type: Journal
DOI: 10.1002/mas.1280090202 Document Type: Article |
Times cited : (249)
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References (106)
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