Semiempirical approach for calculating surface stress: Application to As/Si(001)2×1

Physical Review B - Condensed Matter and Materials Physics

Volumn 60, Issue 7, 1999, Pages 4784-4788

  Che, J G ^a   Zhang, K M ^a,b   Xie, X D ^a,b  

^a FUDAN UNIVERSITY   (China)

^b CCAST WORLD LABORATORY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000541128     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.4784     Document Type: Article

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