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Physical Review B

Volumn 38, Issue 11, 1988, Pages 7511-7519

Structural studies of argon-sputtered amorphous carbon films by means of extended x-ray-absorption fine structure

(4) Comelli, G a Stohr J a Robinson, C J a Jark, W a

a IBM ALMADEN RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000530026 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.38.7511 Document Type: Article

Times cited : (200)

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