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Volumn 59, Issue 12, 1991, Pages 1412-1414
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Study of the composition of thin dielectrics grown on Si in a pure N 2O ambient
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000526980
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.105323 Document Type: Article |
Times cited : (33)
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References (16)
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