Trend robust two-level factorial designs

Biometrika

Volumn 78, Issue 2, 1991, Pages 325-336

  Cheng, Ching Shui ^a   Steinberg, David M ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b TEL AVIV UNIVERSITY   (Israel)

Author keywords

Correlated errors; Foldover design; Run order; Time series model; Time trend

Indexed keywords

EID: 0000512511     PISSN: 00063444     EISSN: None     Source Type: Journal    
DOI: 10.1093/biomet/78.2.325     Document Type: Article

References (0)