Reliability analysis of 4 in. field-emission display

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 15, Issue 2, 1997, Pages 528-532

  Kim, J M ^a   Hong, J P ^a   Kim, J W ^a   Choi, J H ^a   Park, N S ^a   Kang, J H ^a   Jang, J E ^a   Ryu, Y S ^a   Yang, H C ^a   Gorfinkel, B I ^b   Roussina, E V ^b  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^b R and D Institute Volga   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000511536     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589286     Document Type: Article

References (13)

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