Precise total electron yield measurements for impact of singly or multiply charged ions on clean solid surfaces

Review of Scientific Instruments

Volumn 68, Issue 1, 1997, Pages 165-169

  Eder, H ^a   Vana, M ^a   Aumayr, F ^a   Winter, H P ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000508252     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147802     Document Type: Article

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