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Volumn 8, Issue 2, 1996, Pages 173-182

Adaptive penalty methods for genetic optimization of constrained combinatorial problems

Author keywords

Integer programming; Redundancy; Reliability

Indexed keywords


EID: 0000504963     PISSN: 10919856     EISSN: None     Source Type: Journal    
DOI: 10.1287/ijoc.8.2.173     Document Type: Article
Times cited : (165)

References (9)
  • 1
    • 0000970291 scopus 로고
    • A heuristic algorithm and simulation approach to relative location of facilities
    • G.C. ARMOUR and E.S. BUFFA, 1963. A Heuristic Algorithm and Simulation Approach to Relative Location of Facilities, Management Science 9, 294-309.
    • (1963) Management Science , vol.9 , pp. 294-309
    • Armour, G.C.1    Buffa, E.S.2
  • 4
    • 0002651837 scopus 로고
    • An overview of evolutionary algorithms for parameter optimization
    • T. BAECK and H.-P. SCHWEFEL, 1993. An Overview of Evolutionary Algorithms for Parameter Optimization, Evolutionary Computation 1, 1-23.
    • (1993) Evolutionary Computation , vol.1 , pp. 1-23
    • Baeck, T.1    Schwefel, H.-P.2
  • 5
    • 0016638023 scopus 로고
    • Computerized layout design: A branch and bound approach
    • M.S. BAZARAA, 1975. Computerized Layout Design: A Branch and Bound Approach, AIIE Transactions 7, 432-438.
    • (1975) AIIE Transactions , vol.7 , pp. 432-438
    • Bazaraa, M.S.1
  • 6
    • 0003487653 scopus 로고
    • A dual genetic algorithm for bounded integer programs
    • University of Michigan, to appear in R.A.I.R.O.-R.O.
    • J.C BEAN and A.B. HADJ-ALOUANE, 1992. A Dual Genetic Algorithm for Bounded Integer Programs, Technical Report 92-53, University of Michigan, to appear in R.A.I.R.O.-R.O.
    • (1992) Technical Report , vol.92 , Issue.53
    • Bean, J.C.1    Hadj-Alouane, A.B.2
  • 8
    • 0030167877 scopus 로고    scopus 로고
    • Reliability optimization of series-parallel systems using a genetic algorithm
    • in press
    • D.W. COIT and A.E. SMITH, 1996. Reliability Optimization of Series-Parallel Systems Using a Genetic Algorithm, IEEE Transactions on Reliability, 45:2, in press.
    • (1996) IEEE Transactions on Reliability , vol.45 , pp. 2
    • Coit, D.W.1    Smith, A.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.