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Volumn 307, Issue 2, 1997, Pages 185-195

Thermal effect on BaFCl: High-temperature x-ray diffraction

Author keywords

BaFCl; EGA; HTXRD; Rietveld analysis; Thermal expansion

Indexed keywords


EID: 0000498504     PISSN: 00406031     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6031(97)00414-0     Document Type: Article
Times cited : (12)

References (28)
  • 28
    • 0003924016 scopus 로고
    • John Wiley and Sons Inc., New York
    • S.S. Willes, Mathematical Statistics, John Wiley and Sons Inc., New York, 1962, 257.
    • (1962) Mathematical Statistics , pp. 257
    • Willes, S.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.