The Impact of NMOSFET Hot-Carrier Degradation on CMOS Analog Subcircuit Performance

IEEE Journal of Solid-State Circuits

Volumn 30, Issue 6, 1995, Pages 644-649

  Chan, Vei Han ^a   Chung, James E ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000486611     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.387067     Document Type: Article

References (18)

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