Duty cycle improvement for a quadrupole-time-of-flight mass spectrometer and its use for precursor ion scans

European Journal of Mass Spectrometry

Volumn 6, Issue 6, 2000, Pages 471-479

  Chernushevich, Igor V ^a  

^a MDS SCIEX   (Canada)

Author keywords

Duty cycle; Fragment ion; MS MS; Precursor ion; Time of flight mass spectrometry

Indexed keywords

EID: 0000484001     PISSN: 14690667     EISSN: None     Source Type: Journal    
DOI: 10.1255/ejms.377     Document Type: Article

References (13)

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