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Walton, R.A.2
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MADNES, Munich Area Detector (New EEC) System, version EEC 11/9/89
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with enhancements by Enraf-Nonius Corp., Delft, The Netherlands. A description of MADNES appears in: A. Messerschmitt, J. Pflugrath
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J. Pflugrath, A. Messerschmitt, MADNES, Munich Area Detector (New EEC) System, version EEC 11/9/89, with enhancements by Enraf-Nonius Corp., Delft, The Netherlands. A description of MADNES appears in: A. Messerschmitt, J. Pflugrath, J. Appl. Crystallogr. 20 (1987) 306.
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SHELXTL V.5, Siemens Industrial Automation Inc., Madison, WI, 1994.
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G.M. Sheldrick, in: H.D. Flack, L. Parkanyi, K. Simon (Eds.), Crystallographic Computing 6, Oxford University Press, Oxford, 1993, p. 111.
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Sheldrick, G.M.1
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16
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0033536471
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x has appeared. See: M.E. Prater, L.E. Pence, R. Clérac, G.M. Finniss, C. Campana, P. Auban-Senzier, D. Jérome, E. Canadell, K.R. Dunbar, J. Am. Chem. Soc. 121 (1999) 8005.
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Jérome, D.7
Canadell, E.8
Dunbar, K.R.9
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17
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0009128971
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3) have been mentioned as intermediates in the synthesis of other rhodium compounds. See: F.J. Lahoz, A. Martin, M.A. Esteruelas, E. Sola, J.L. Serrano, L.A. Oro, Organometallics, 10 (1991) 1794.
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Lahoz, F.J.1
Martin, A.2
Esteruelas, M.A.3
Sola, E.4
Serrano, J.L.5
Oro, L.A.6
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