|
Volumn 352, Issue 3, 1995, Pages 618-621
|
TSC data-analysis on heavily irradiated silicon detectors
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 0000476097
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-9002(95)90016-0 Document Type: Article |
Times cited : (18)
|
References (10)
|