In situ x-ray diffraction topography studies on the phase formation in thin yttrium hydride films

Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 3, 2000, Pages 2164-2172

  Remhof, A ^a   Song, G ^a   Sutter, C ^a   Labergerie, D ^a   Hubener M ^a   Zabel, H ^a   Hartwig J ^b  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000470550     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.62.2164     Document Type: Article

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