Cross-sectional TEM of Pd/lnP and Au/lnP interfaces formed at substrate temperatures near 300 and 77K

Journal of Electronic Materials

Volumn 25, Issue 10, 1996, Pages 1645-1651

  Palmer, J W ^a   Anderson, W A ^a   Hoelzer, D T ^b   Thomas, M ^c  

^a UNIVERSITY OF MASSACHUSETTS   (United States)

^b ALFRED UNIVERSITY   (United States)

^c Department of Obstetrics Gynecology   (United States)

Author keywords

Barrier height; Inp; Interfaces; Transmission electron microscopy (TEM)

Indexed keywords

EID: 0000469984     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02655591     Document Type: Article

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