|
Volumn 482-485, Issue PART 2, 2001, Pages 1368-1373
|
The surface structure and charge distribution of ZrSe3 and ZrTe3
|
Author keywords
Chalcogens; Scanning tunneling microscopy; Single crystal surfaces; Surface structure, morphology, roughness, and topography
|
Indexed keywords
|
EID: 0000461769
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(01)00840-8 Document Type: Article |
Times cited : (9)
|
References (12)
|