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Journal of Applied Physics

Volumn 87, Issue 8, 2000, Pages 3850-3857

Combining x-ray and optical spectroscopies in the study of dilute semiconductor nanoparticle composites

(6) Persans, P D a Lurio, L B a,b Pant, J a Yukselici H a Lian, G a Hayes, T M a

a RENSSELAER POLYTECHNIC INSTITUTE (United States)

b MASSACHUSETTS INSTITUTE OF TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000459918 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.372424 Document Type: Article

Times cited : (29)

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