Interdiffusion of CdS/CdTe thin films: Modeling x-ray diffraction line profiles

Journal of Applied Physics

Volumn 89, Issue 2, 2001, Pages 988-994

  McCandless, Brian E ^a   Engelmann, Michael G ^b   Birkmire, Robert W ^a  

^a UNIVERSITY OF DELAWARE   (United States)

^b TREX ENTERPRISES CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000456841     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1330245     Document Type: Article

References (16)

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