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Volumn 15, Issue 6, 1997, Pages 2940-2945

Super-smooth x-ray reflection grating fabrication

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000453768     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589759     Document Type: Article
Times cited : (45)

References (17)
  • 1
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    • IAU Colloquium 115, edited by P. Gorenstein and M. Zombeck Columbia University Press, New York
    • S. M. Kahn, in High Resolution X-ray Spectroscopy of Cosmic Plasmas, IAU Colloquium 115, edited by P. Gorenstein and M. Zombeck (Columbia University Press, New York, 1990), pp. 365-375.
    • (1990) High Resolution X-ray Spectroscopy of Cosmic Plasmas , pp. 365-375
    • Kahn, S.M.1
  • 3
    • 4143125176 scopus 로고
    • edited by E. Wolf North-Holland, Amsterdam
    • G. W. Stroke, in Progress in Optics, Volume II, edited by E. Wolf (North-Holland, Amsterdam, 1963), pp. 45-47.
    • (1963) Progress in Optics , vol.2 , pp. 45-47
    • Stroke, G.W.1
  • 10
    • 4143074381 scopus 로고
    • Multilayer Structures and Laboratory X-ray Laser Research, edited by N. M. Ceglio and P. Dhez SPIE, Bellingham, WA
    • D. R. Ciarlo and D. E. Miller, in Multilayer Structures and Laboratory X-ray Laser Research, Proc. SPIE, edited by N. M. Ceglio and P. Dhez (SPIE, Bellingham, WA, 1986), Vol. 688, p. 163.
    • (1986) Proc. SPIE , vol.688 , pp. 163
    • Ciarlo, D.R.1    Miller, D.E.2
  • 11
    • 4143124048 scopus 로고    scopus 로고
    • Master's thesis, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, May
    • A. Franke, Master's thesis, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, May, 1997.
    • (1997)
    • Franke, A.1
  • 13
    • 0010805287 scopus 로고
    • EUV, X-ray, and Gamma-ray Instrumentation for Astronomy II, edited by O. H. Rothchild and R. E. Seigmund SPIE, Bellingham WA
    • J. V. Bixler, C. J. Hailey, C. W. Mauche, P. F. Teague, R. S. Thoe, S. M. Kahn, and F. B. S. Paerels, in EUV, X-ray, and Gamma-ray Instrumentation for Astronomy II, Proc. SPIE, edited by O. H. Rothchild and R. E. Seigmund (SPIE, Bellingham WA, 1991), Vol. 1549, pp. 420-8.
    • (1991) Proc. SPIE , vol.1549 , pp. 420-428
    • Bixler, J.V.1    Hailey, C.J.2    Mauche, C.W.3    Teague, P.F.4    Thoe, R.S.5    Kahn, S.M.6    Paerels, F.B.S.7
  • 14
    • 4143058780 scopus 로고    scopus 로고
    • in preparation
    • S. M. Kahn et al. (in preparation).
    • Kahn, S.M.1
  • 16
    • 4143108675 scopus 로고    scopus 로고
    • private communication
    • F. B. S. Paerels (private communication).
    • Paerels, F.B.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.