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Volumn 82, Issue 1, 1997, Pages 297-302
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Hot-electron-induced quasibreakdown of thin gate oxides
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000451121
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.365812 Document Type: Article |
Times cited : (34)
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References (17)
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