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Volumn 49, Issue 5, 1994, Pages 4455-4465
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Simulations of rf glow discharges in SF6 by the relaxation continuum model: Physical structure and function of the narrow-gap reactive-ion etcher
a a a a
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KEIO UNIVERSITY
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000445536
PISSN: 1063651X
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevE.49.4455 Document Type: Article |
Times cited : (109)
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References (43)
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