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Volumn 72, Issue 4, 1998, Pages 462-464
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Excess silicon at the Si3N4/SiO2 interface
a a a b |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000443705
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.120786 Document Type: Article |
Times cited : (29)
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References (19)
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