Effect of multistep wafer-annealing on main traps in Czochralski-grown semi-insulating GaAs

Applied Physics Letters

Volumn 69, Issue 22, 1996, Pages 3417-3419

  Fang, Z Q ^a   Look, D C ^a   Yamamoto, H ^b   Shimakura, H ^b  

^a WRIGHT STATE UNIVERSITY   (United States)

^b JAPAN ENERGY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000441786     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117278     Document Type: Article

References (20)

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